Originally published in 2005 this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions electron beam instrumentation X-ray spectrometry general principles of SEM image formation production of X-ray 'maps' showing elemental distributions procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive) the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers and practical matters such as sample preparation and treatment of results. Throughout there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers as well as those working in industrial laboratories. Language: English